High Quality Portable Handheld XRF Spectrometer/ Mining Analyzer IP54 32G Storage for Onsite Mining Analysis/ XRF Metal Analyzer: Non-Destructive, Instant Material Verification
The XRF Metal Analyzer is the device which is known as the standard in the field for its fast, non-destructive Elemental Evaluation and Positive Material Identification (PMI).
It’s widely used in scrap sorting, crafting quality control, alloy verification, and matching the product quality with regulatory compliance, this handheld instrument will help you in instantly determining the total chemical composition and for the identification of the grade of metals and alloys.
It offers your laboratory the utmost quality results in seconds, which means the time and expenditure is reduced so much, when compared to the traditional ways of testing.
How It Works?
Preparation: When it comes to operating this device, you need minimal preparation and it is also very easy to work with.
Measurement Initiation: The operator needs to just simply put the examination window against the specimen which is used for testing and start the initiation of the measurement.
Excitation: The built-in X-ray tube creates a primary X-RAY beam that makes the atoms excited in the specimen.
Emission: These excited atoms will instantly begin to release secondary or fluorescent, X- Rays.
Crucially: Each and every element will produce an energy signature which is unique in its own.
Detection: The analyzer’s hi-tech detection system will calculate both the energy and intensity of the emissions.
Analysis: The internal software works tremendously and also quickly processes the data given to it.
Output: This equipment instantly presents the exact percentage of the concentration of element, which will lead to the instant identification of alloy grade.
The Principles on Which It Works
- Technology Basis: The technology used in this amazing product is based on the unchanging laws of X-ray fluorescence (XRF) spectroscopy.
- Atomic Structure: Each and every chemical element consists of a special electronic structure.
- Mechanism: When exposed to the two high-energy levels of X-rays:
- Internal shell electrons are emitted.
- Outer-shell electrons drop so that they can fill the vacant places.
- Fluorescence: This electron transition generates and releases energy which will be in the form of a fluorescent X-ray photon.
- Element Identification: The energy here of the photon shows the properties of the element like iron generates one type of signature, nickel a different one.
- Concentration Measurement: The intensity (number) of this characteristic signature helps in the determination of the concentration of that particular element in the specimen.
Technical Specification
|
Weight
|
Less than 1.4kg (including battery)
|
|
Size
|
184mm x 267mm x 84mm
|
|
Power supply
|
Plug-in rechargeable lithium battery, rechargeable inside the device or using an external charger, AC power supply, hot-swappable function (maximum swap time 60 seconds)
|
|
Display
|
5-inch color touchscreen, smartphone-style display – Power VR SGX540 3D Graphics
|
|
Dual Camera
|
Internal camera for viewing samples before and during analysis for proper sample alignment. Macro camera for scanning QR codes or barcodes and photo documentation and report generation.
|
|
Communication/data transmission
|
Wi-Fi, Bluetooth, USB connects to most devices, including Profile Builder PC software.
|
|
Excitation source
|
6-50kV, 200uA rhodium target for alloy analysis, 6-50kV, 200uA gold target for most other applications
|
|
Electronics Processing and Host Processing
|
1.2GHz quad ARM Cortex A53 64/32-bit, RAM: 1GB LP-DDR3, Storage: 16 GB eMMC (storage)
|
|
Detector
|
20mm² silicon drift detector (effective area), 135eV resolution FWHM, 5.95Mn K-α line
|
|
X-ray filter
|
x6 filter wheel for beam optimization
|
|
Processor
|
ARM Cortex-A9 Dual Core/1.2GHz Memory: 1GB DDR2 RAM, 8GB SD
|
|
Pulse processor
|
14-bit analog-to-analog conversion, 80MSPS sampling rate, 8K channel MCA, USB2.0 high-speed data transfer to host processor; FPGA
applies digital filtering for high-throughput pulse processing (50 nS – 24 uS peak time) |
|
Communication/data transmission
|
Wi-Fi, Bluetooth, and USB connectivity to most devices, including Profile Builder PC software. management options
|
|
Calibration method
|
Basic parameters, Compton normalization and/or Compton normalization are used for alloy analysis. Terraforming Chemical, Environmental and Soil Calibration
|
|
Calibration check
|
Internal 316 stainless steel standard sample for calibration verification and energy scale verification
|
|
Operating ambient temperature range
|
-20 ℃ ~ 55 ℃
|
|
Safety
|
Password protection usage (user level) and internal settings (admin)
|
|
Specification
|
CE, RoHS, USFDA certified, compliant with Canadian RED Act.
|
Why Must You Choose Yatherm Scientific: The Best in Handheld Examination
Yatherm Scientific’s XRF Metal Analyzers are structured to do outstanding performance even in the most demanding industrial workspaces.
Our equipment is loaded with high-performance Silicon Drift Detectors (SDD) for best resolution and also to provide a quicker light element evaluation (like Mg, Al, Si etc) making sure you don’t miss any key component of the alloy.
Our instruments come with features like rugged, sealed, and dust/moisture-resistant housing and an exceptional battery life for better performance, giving you an absolute guarantee of maximum trust in any field condition. Yatherm Scientific offers solid data management and reporting tools, which enables your compliance tracking with effortless ease.
Choose Yatherm Scientific if you want to experience the most precise, endurable and quickest, most advanced XRP technology accessible at this time, which will give you the utmost effectiveness and material accountability in your operations.
